Course title: X-Ray Diffraction
CHBE 583
Fall 2009
Meetings:
Tue 14:00 – 15:50 (B-541)
Thu 16:00 – 16:50 (B-525)
Instructor:
Prof. Dr. A. Cuneyt Tas
www.cuneyttas.com
Course
content:
Principles of powder diffraction, Bragg Law, Diffraction from a set of
reflecting planes, The unit cell (2 weeks);
The powder diffractometer, Axial
divergence, Absorption, Displacement errors, Receiving and divergence slits (2 weeks);
Factors influencing d-spacing accuracy, Factors influencing intensity
accuracy, Automation of qualitative phase analysis, Computer databases, Use of
standards (2 weeks);
Sample preparation for X-ray diffraction, The
internal-standard method of quantitative analysis (1 week);
Computer analysis of diffraction data, ICDD PDF-2 database, Analysis of
d-I data, Analysis of digitized diffraction traces, Structure modeling, Structure refinement, Crystallinity,
Crystal size and strain (2 weeks);
The Rietveld method of
pattern-fitting structure refinement (2 weeks).
Textbook:
Title:
Fundamentals of Powder Diffraction and Structural Characterization of Materials
Authors:
Vitalij Pecharsky and Peter
Zavalij
Publisher:
Springer Science, Publication Date: 2005, ISBN: 0387241477
Reference
Book:
Title:
Powder Diffraction: The Rietveld Method and the Two
Stage Method to Determine and Refine
Author:
Georg Will
Publisher:
Springer, Publication Date: 2005, ISBN: 3540279857
Grading:
2
exams (25% each)
Final
exam (30%)
Term
project (20%)